고에너지분해능 주사투과전자현미경-최외각전자 에너지손실 분광법(STEM-VEELS)을 이용한 국소 밴드갭 측정

• 영문명: Local Bandgap Measurement using Monochromated STEM-VEELS
• 발행기관: 한국세라믹학회
• 저자명: 정희준(Hee Joon Jung)
• 간행물 정보: 『세라미스트』제28권 제2호, 202~221쪽, 전체 20쪽
• 주제분류: 공학 > 화학공학
• 파일형태: PDF
• 발행일자: 2025.06.30

국문 초록

This paper outlines the fundamentals and recent advancements in monochromated Scanning transmission electron microscopy-valence electron energy loss spectroscopy (STEM-VEELS) as a tool for bandgap characterization. Particular focus is given to experimental strategies such as Zero-loss peak (ZLP) subtraction, onset detection, and mitigation of spectral artefacts including Cerenkov radiation and guided optical modes. Case studies involving quantum dots, dielectrics, and low-dimensional semiconductors are discussed to highlight the capability of STEM-VEELS to resolve local bandgap variations. Future opportunities including AI-assisted analysis and time-resolved VEELS are also addressed.

목차

1. 서론

2. STEM-VEELS 기반 밴드갭 측정 원리

3. STEM-VEELS 측정을 위한 실험 조건

4. ZLP 제거와 inelastic 시작점(=bandgap) 판정

5. 체렌코프 복사와 유도 광 모드 억제

6. 대표 응용 사례

7. 최신 동향과 전망

8. 결론

REFERENCES

키워드

Bandgap Dielectric function Monochromated STEM-VEELS Valence electron energy loss spectroscopy (VEELS) ZLP subtraction