Ray Parenchyma and Ray Tracheid Structure of Four Korean Pine Wood Species

• 발행기관: 한국가구학회
• 저자명: Ahmed Sheikh Ali Chong Song-Ho Chun Su-Kyoung Park Byung-Su
• 간행물 정보: 『한국가구학회지』제17권 제4호, 101~107쪽, 전체 7쪽
• 주제분류: 예술체육 > 미술
• 파일형태: PDF
• 발행일자: 2006.11.30

영문 초록

To know the structural difference between the ray parenchyma and ray tracheid among Pinus densiflora, Pinus rigida, Pinus koraiensis and Larix kaempferi, an observation was carried out under the FE-SEM. The longest ray parenchyma and ray tracheid were found in Pinus koraiensis species while the shortest ray tracheid and ray parenchyma were found in Pinus densiflora and Larix kaempferi. Larix kaempferi had more than one endwall pit in its ray parenchyma. Pinus densiflora was found highest in the pit aperture diameter in ray tracheid and aperture diameter in the cross-field pit. The pit border width in ray tracheid and lumen diameter of ray parenchyma were found highest in Pinus rigida. The cell wall thickness of ray parenchyma and pit aperture diameter in endwall pit of ray tracheid were found highest in Pinus koraiensis compared to other species.

목차

1. Introduction

2. Materials and Methods

3. Result and Discussion

4. Conclusion

5. References

키워드

Ray tracheid ray parenchyma endwall pit cross-field pit