Four Point Bending Test for Adhesion Testing of Packaging Strictures: A Review

• 발행기관: 한국마이크로전자및패키징학회
• 저자명: Kenny Mahan Bongtae Han
• 간행물 정보: 『마이크로전자 및 패키징학회지』제21권 제4호, 33~39쪽, 전체 7쪽
• 주제분류: 공학 > 산업공학
• 파일형태: PDF
• 발행일자: 2014.12.31

영문 초록

To establish the reliability of a packaging structures, adhesion testing of key interfaces is a critical task. Due to the material mismatch, the interface may be prone to delamination failure due to conditions during the manufacturing of the product or just from the day-to-day use. To assess the reliability of the interface adhesion strength testing can be performed during the design phase of the product. One test method of interest is the four-point bending (4PB) adhesion strength test method. This test method has been implemented in a variety of situations to evaluate the adhesion strength of interfaces in bimaterial structures to the interfaces within thin film multilayer stacks. This article presents a review of the 4PB adhesion strength testing method and key implementations of the technique in regards to semiconductor packaging.

목차

1. 서론

2. 실험 방법

3. 결과 및 고찰

4. 결론

감사의 글

References

키워드

four-point bending (4PB) adhesion thin structures multi-layers packaging