- 영문명
- Design of Low Cost TR Tester used of Microcontroller
- 발행기관
- 군산대학교 수산과학연구소
- 저자명
- 채규훈(Cya-GYU Hoon)
- 간행물 정보
- 『군산대학교 수산과학연구소 연구논문집』제4집, 319~327쪽, 전체 9쪽
- 주제분류
- 농수해양 > 수산학
- 파일형태
- 발행일자
- 2004.07.02

국문 초록
영문 초록
Test process is essential to decide good or bad quality of produced transistor. However the bad products can remain after the test process, due to mixture of unwanted transistors in the process of house holding or management. Thus, we have to remove the bad ones by adding another test process before tapping or packing the products. This post-process is generally accepted in industry, since the product management, specially semi-conductor product is evaluated in PPM unit. The cost of production however should not increase with another test process. We have to get a test equipment that test the necessified characteristics in short time with low cost. To fulfill these demands a cheap and simple system is need ever though some equipments have been developed and operated. In this research, we check only 2 parameters, hFE and VCEO among the parameters of transistor to avoid the mixture of bad products and design a low cost test equipment. Since the equipment check only 2 parameters, it is fast and cheap. In addition, it is
designed with low power consumption and small size for easy installation.
목차
Abstract
Ⅰ.서론
Ⅱ.시스템의 개요
Ⅲ.회로 설계
Ⅳ.소프트웨어 설계
Ⅴ.실험 및 고찰
Ⅵ.결론
참고문헌
키워드
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