엑스선 현미경 분야에서의 최근 기술 혁신 및 발전 동향

• 영문명: Recent Technological Innovations and Advances in X-Ray Microscopy
• 발행기관: 한국세라믹학회
• 저자명: 이성진(Sungjin Lee)
• 간행물 정보: 『세라미스트』제28권 제2호, 242~256쪽, 전체 15쪽
• 주제분류: 공학 > 화학공학
• 파일형태: PDF
• 발행일자: 2025.06.30

국문 초록

Since the discovery of X-ray, it has been used extensively to image internal structures or chemical compositions of materials varying from human body to battery cells. X-rays have short wavelengths and high energy compared with visible light and do not reflect or refract easily. The strong penetration capability of X-rays led to the invention of X-ray microscopy (XRM). XRM is thus a very powerful too that can be utilized to non-destructively image internal structures of materials, and with various image processing software, reconstruct 3-dimensional images. Although electron microscopy provides higher resolution images, XRM can scan thicker or denser materials without extensive preparation. Thanks to these advantages, XRM became widespread worldwide to be used in diverse fields of research and industry. With this growing interest, it is essential that researchers who are trying to use it understand basic properties and technical terms to exploit the full capacity of XRM. In this review, technological advances regarding resolution and contrast of XRM are investigated after the history and types of XRM are introduced. More recent innovations of laboratory and synchrotron-based systems are also explored, with existing models and facilities. Finally, the seemingly bright future of XRM, which is of course not precisely predictable, is briefly covered.

목차

1. 제목

2. 본론

3. 결론

REFERENCES

키워드

Micro-CT Nano-CT Synchrotron X-Ray X-Ray Microscopy