전계 이온 현미경을 다시 위대하게

• 영문명: Make Field Ion Microscopy Great Again
• 발행기관: 한국세라믹학회
• 저자명: 이창기(Chang-Gi Lee) 이원형(Won-Hyoung Lee) 김세호(Se-Ho Kim)
• 간행물 정보: 『세라미스트』제28권 제2호, 151~167쪽, 전체 17쪽
• 주제분류: 공학 > 화학공학
• 파일형태: PDF
• 발행일자: 2025.06.30

국문 초록

“Ja atoms! Ja atoms!” shouted Erwin Müller upon first observing individual atoms using Field ion microscopy (FIM), a landmark in atomic-scale imaging. Since then, FIM has profoundly impacted materials science, offering unmatched atomic resolution through electric-field-induced ionization. This review systematically explores FIM’s theoretical foundations, historical evolution, and instrumental developments. Despite modern imaging methods, FIM uniquely reveals atomic surface dynamics, arrangements, and diffusion processes. Recent technological advancements integrating computational methods and enhanced detectors have overcome previous limitations, revitalizing interest in FIM and promising future breakthroughs in materials research.

목차

1. Introduction

2. FIM의 기본 원리

3. 이미지 형성 및 공간 분해능

4. 재료과학에서 FIM의 응용

5. FIM의 한계와 미래 전망

6. Conclusions

REFERENCES

키워드

Field evaporation Field ion microscopy Single atom observation